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Titanic Issues In APC: Do Icebergs Loom On The Horizon?
(1/12/2005) Future Fab Intl. Issue 18
By Alan Weber, Alan Weber & Associates, Inc.
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Icebergs by themselves aren’t bad or good – they just are. The important part is knowing what’s under the surface and what impact that can have, whether it’s a physical structure, a complex control system, or an observed behavioral phenomenon. It is much the same with the advanced process control (APC) segment of the semiconductor manufacturing industry at this moment. This article highlights a number of the major technical and business issues facing the industry and goes beneath the surface to explain the deeper forces at work. Specifically, it will dive into the topics of data, standards, market structure and end user application development.

A number of leading-edge users have pointed out that the current generation of production semiconductor APC technologies will soon run out of steam – and this is especially true of the statistically based algorithms prevalent in most fault detection/classification (FDC) systems. The continued evolution of run-to-run control (R2R) and FDC applications capability depends on the use of increasing amounts of product, process, equipment and sensor data; however, the state of the practice in today’s process data collection and management systems is a serious limitation.

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