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One way to view the local electrode atom probe (LEAP) approach is that it extends field emission microscopy from an academic exercise into the world of routine analysis. Practical, 3D atomic maps of conductive samples have been demonstrated. One can find where the boron atoms are in doped silicon or look at the structure of stacked multilayers. Present LEAP technology counts between 50 percent and 80 percent of the atoms. Of course, LEAP is advancing quickly, and one can expect this to improve every year. LEAP moves the dream of 3-D atomic maps closer to reality. I can’t wait to see atomic maps of nanowires and nanotubes.
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