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Advanced X-ray based thin-film metrology from Jordan Valley. For resolution, nothing else measures up.
(7/9/2007) Future Fab Intl. Issue 23
By Jordan Valley Business Development, Jordan Valley Semiconductors, Inc.
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You wouldn’t settle for poor resolution at home. Why allow it in your fab?

The JVX™ 6200 utilizes angstrom-level incident illumination to provide angstrom-level accuracy and resolution. Its patented design is unmatched in characterizing interfaces and material properties.

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